Understanding the Laureate™ Digital Panel Meter for Time Interval of Periodic Events
The Laureate™ 1/8 DIN Digital Panel Meter for A-to-B Time Interval can display pulse width or time delay between individual pulses to a resolution of 0.2 µs, or the average pulse width or average time delay across multiple pulses. Timing starts when a pulse is applied to Channel A (selectable positive or negative edge) and ends when a pulse is applied to Channel B (selectable positive or negative edge). For a single pulsed signal, A and B inputs can be tied together, with a positive or negative slope starting timing and the opposite slope stopping it.
Timing Technique and Resolution
Timing is achieved by counting 5.5 MHz clock pulses. Multiple integral time intervals are averaged over a gate time selectable from 10 ms to 199.99 s, which also controls display update time. Resolution scales by range: 1 ms for 0-199.999 s, 100 µs for 0-99.9999 s, 10 µs for 0-9.99999 s, 1 µs for 0-.999999 s, and 0.2 µs for 0-.099999 s. For times under 100 ms, display resolution down to 0.2 µs can be achieved by applying a ×10 multiplier, shifting the decimal point one position, and averaging many time intervals.
Rate From Time and Signal Specifications
Highly accurate rate can be displayed by taking the inverse of time, with arithmetic capability for engineering units like meters/sec — this requires the Extended main board. Periodic timing interval equals gate time plus 30 ms plus 0-2 time intervals; Time Before Zero Output is separately selectable from 10 ms to 199.99 s. Maximum applied voltage is 600 Vac for the 20V/200V/300V ranges, 125 Vac for other ranges; overcurrent protection is 25x for 2 mA, 8x for 20 mA, 2.5x for 200 mA, 1x for 5A.
Real-World Applications
- Time Interval Mode for Time Delay — for periodic pulses on A and B channels, time delays are measured to 0.2 µs resolution from the rising or falling edge of A to the rising or falling edge of B.
- Time Interval Mode for Pulse Width — pulse width is measured by tying A and B channels together, with readings averaged over a user-selectable gate time.
- Timing Process Dynamics — start and stop pulses generated by the dual relay board in a Laureate panel meter or digital counter, such as pulse edges created as temperature passes two alarm setpoints or cycles in hysteresis control.
- Rate Based on 1/Time — a pulse or switch closure initiates timing, another stops it, with multipliers programmed to display rate in engineering units like meters/sec for any duration.
- Replacing an Oscilloscope — for fixed installations needing digital timing accuracy and control outputs, 0.2 µs resolution is feasible at low cost.
- Instrumenting a Pulsed Laser System — one of many possibilities using Laureate dual-channel counters.
Factory-Calibrated Accuracy
All signal conditioner board ranges are factory-calibrated, with calibration factors stored in EEPROM. Field replacement of the signal conditioner board doesn't require recalibrating the meter. Factory recalibration is recommended annually.
Where Time Interval Digital Panel Meters Are Used
- Laser Pulse Characterization — pulse width, separation, and repetition rate measurement.
- Delay & Propagation Timing — time-delay measurement between correlated events on separate channels.
- Fixed-Installation Test Bench Replacement — permanent digital timing with control outputs.
- Process Dwell Timing — relay-triggered interval measurement for temperature or process cycling.
- PWM & Duty Cycle Verification — pulse width timing via tied A-B channel configuration.
- High-Speed Component Response Testing — microsecond-resolution delay measurement.
- Rate-From-Time Velocity Applications — speed calculation from timed intervals between two trigger points.
Time Interval Digital Panel Meter Frequently Asked Questions
Why does the meter's resolution improve as the measured time range gets shorter (1 ms at the top range down to 0.2 µs at the bottom)?
The meter's underlying timing mechanism is documented as counting a fixed 5.5 MHz clock — since the meter's six-digit display has a fixed number of digits to represent the reading, a shorter maximum range lets each display digit represent a proportionally finer absolute time increment, which is why the documented resolution scales finer as the selected range shrinks.
How does the ×10 multiplier trick actually extend resolution below 100 ms without the meter's underlying clock rate changing?
Documented technique specifically describes applying a ×10 multiplier and shifting the decimal point one position while averaging many time intervals — this doesn't change the meter's fundamental clock-counting resolution, but combines display scaling with intentional averaging across multiple measured intervals to extract finer effective resolution than a single raw reading would show.
Does averaging multiple time intervals over a longer gate time trade off measurement speed for improved reading stability?
Yes — a longer gate time allows more individual time intervals to be averaged into each displayed reading, generally smoothing out interval-to-interval variation, but also means the display updates less frequently; this is the same general responsiveness-versus-stability tradeoff documented across other Laureate counter modes using gate time.
Why does the "Rate Based on 1/Time" mode specifically require the Extended main board rather than being available on the Standard board?
Documented capability specifically distinguishes the Extended main board as offering additional programmable functions beyond the Standard board, including the arithmetic processing (taking the inverse of time and applying multipliers to reach engineering units) that this rate-display mode depends on — the Standard board's documented feature set doesn't include this additional computation layer.
Does tying Channels A and B together for pulse-width measurement limit the meter to only positive-going pulses, or can it measure negative pulses too?
Documented setup specifically describes selecting a positive or negative slope to start timing, with the opposite slope required to stop timing — this framing applies symmetrically regardless of whether the pulse itself is a positive-going or negative-going pulse, since what matters is which edge direction is configured as the start trigger versus the stop trigger.
In the timing process dynamics application, does the relay board need to be a specific type, or can any Laureate relay-equipped instrument generate the start/stop pulses?
Documented description specifically references "a Laureate panel meter or digital counter" equipped with the dual relay board as the source of start and stop pulses, without restricting this to a specific relay board sub-type — any Laureate instrument with relay outputs configured to change state at the desired trigger conditions (such as two temperature alarm setpoints) can serve this role.
Does the documented "0-2 time intervals" component of the periodic timing interval formula mean up to two complete measurement cycles could be effectively wasted waiting for the next valid interval?
Yes, in the worst case — this documented uncertainty term reflects that after the gate time and fixed 30 ms overhead elapse, the meter may need to wait for the next one or two signal periods to complete a valid measurement before returning a reading, meaning actual response time can vary by up to roughly two signal periods depending on where in the input signal's cycle the gate time happens to end.
Can this meter genuinely substitute for an oscilloscope in every application, or only specific ones?
Only specific ones — documented positioning specifically frames this as the better choice for fixed installations needing digital timing accuracy and control outputs, not as a general oscilloscope replacement; an oscilloscope remains necessary for actually viewing waveform shape, which this meter's numeric timing display doesn't provide.
Does the maximum applied voltage rating (600 Vac vs. 125 Vac depending on range) mean the meter's own timing signal is expected to be that high, or is this a separate protection spec?
This is documented as a protection specification rather than the meter's normal working signal level — timing pulses used for time interval measurement are typically low-level logic or sensor signals, and the 600 Vac / 125 Vac figures describe the input circuitry's rated tolerance against an accidental fault voltage on that range, not the intended operating voltage of a genuine timing signal.
Can the overcurrent protection multipliers (25x for 2 mA, down to 1x for 5A) be interpreted the same way regardless of which range is selected for a given application?
Yes, in the sense that each multiplier is documented relative to its own range's full-scale current — the lower-current ranges carry proportionally more overcurrent headroom because an overcurrent event relative to a small full-scale rating is still a modest absolute current, while the 5A range's 1x rating reflects that its full-scale current is already substantial, leaving comparatively little additional margin before the protection circuitry's own limits are reached.
Timing Jitter & Statistical Averaging Questions From the Field
Does averaging a genuinely large number of timing samples always keep reducing measurement error proportionally, or does the benefit eventually taper off?
Documented analysis of time-of-arrival estimation specifically shows diminishing but real returns — averaging over 100 samples was documented as reducing estimated error from roughly 0.5 of a unit interval down to about 0.06, a substantial but non-linear improvement; the underlying statistical principle is that averaging reduces random error roughly with the square root of the sample count, meaning each additional doubling of samples yields a progressively smaller marginal improvement.
Does the specific statistical distribution of timing jitter (uniform versus Gaussian) change whether averaging is an effective error-reduction strategy?
Not fundamentally — documented simulation results specifically found that averaging remained effective at reducing time-of-arrival estimation error under both a uniform jitter distribution assumption and a more realistic Gaussian jitter distribution, indicating averaging is a broadly applicable technique across different underlying jitter statistics rather than being valid only for one specific distribution shape.
Why do documented jitter-measurement best practices specifically recommend against measuring individual timing samples in isolation?
Documented guidance specifically explains that jitter varies randomly, or with a random component, meaning individual measurements are typically of little standalone value — the documented recommendation is analyzing jitter statistically using tools like histograms across many measurements, extracting parameters like standard deviation and peak values, rather than drawing conclusions from any single measured interval.
Does a longer measurement record (more samples collected) genuinely improve the statistical confidence in a jitter or timing measurement, or is sampling rate what matters more?
Both matter, but for different reasons — documented guidance specifically recommends selecting a relatively large record length specifically so a significant population of jitter data can be captured for statistical analysis, while separately recommending the highest available sampling rate specifically to minimize interpolation error in resolving each individual edge; record length and sampling rate address two genuinely different sources of measurement uncertainty.
Can averaging repeated timing measurements introduce its own distortion, or is it a purely beneficial technique?
It can introduce distortion under some conditions — documented analysis specifically notes that when the underlying signals being averaged contain jitter, the averaged result can be distorted, with higher-frequency content in the result attenuated more than the rest, often visible as artificially slower-looking rising edges in the averaged waveform; averaging isn't a purely beneficial technique without any tradeoffs.
Does re-triggering a time-interval measurement immediately after each reading, without any dead time, generally improve or degrade measurement quality?
Documented technical analysis specifically notes that re-triggering a time-interval measurement typically requires a meaningful dead time between successive measurements, particularly when time interpolation techniques are used to achieve finer-than-clock-period resolution — attempting to eliminate that dead time entirely is documented as a practical limitation rather than a straightforward improvement.
Is there a documented, standard set of statistical parameters typically reported from a batch of repeated timing measurements?
Yes — documented convention specifically reports the count of periods or intervals evaluated, the highest observed jitter value over the measurement window, and the standard deviation of all measured values across that window as the standard statistical summary, often supplemented by histogram or time-versus-time plots for deeper analysis.
Does disabling waveform or reading averaging ever improve, rather than degrade, the accuracy of a specific timing or jitter measurement?
Yes, in specific documented cases — guidance for setting up accurate jitter measurements specifically recommends disabling waveform averaging as one of several steps to reduce measurement error, since the goal in that specific context is to capture and characterize the genuine, unaveraged variation present in the signal rather than smoothing it away before analysis.























Slide the meter into a 45 x 92 mm 1/8 DIN panel cutout. Ensure that the provided gasket is in place between the front of the panel and the back of the meter bezel.
The meter is secured by two pawls, each held by a screw, as illustrated. Turning each screw counterclockwise extends the pawl outward from the case and behind the panel. Turning each screw clockwise further tightens it against the panel to secure the meter. 






